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How Large-Signal Measurement Techniques Improve the Accuracy of Microwave Transistor Nonlinear Models
Raffo, A.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
Asia-Pacific Microwave Conference Proceedings, APMC
Vol. 2022-, No. 1, pp: 178-180, Anno: 2022 |
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Exploitability of Butt-Coupling between Single Mode/Multi Mode VCSEL and G.652 SSMF for future Green Radio-over-Fiber Infrastructures
Nanni, J.; Saderi, G.; Bellanca, G.; Bosi, G.; Raffo, A.; Vadala, V.; Debernardi, P.; Polleux, J. -L.; Tartarini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2022 Italian Conference on Optics and Photonics, ICOP 2022
pp: 1-4, Anno: 2022 |
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200-W GaN PA Design Based on Accurate Multicell Transistor Modeling
Vadala, V.; Raffo, A.; Bosi, G.; Barsegyan, A.; Custer, J.; Formicone, G.; Walker, J.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
IEEE MTT-S International Microwave Symposium Digest
Vol. 2022-, No. 1, pp: 378-381, Anno: 2022 |
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mm-Wave GaN HEMT Technology: Advances, Experiments, and Analysis
Vadala, V.; Crupi, G.; Giofre, R.; Bosi, G.; Raffo, A.; Vannini, G.
dettagli >>
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IEEE Computer Society,
Mediterranean Microwave Symposium
Vol. 2022-, No. 1, pp: 420-425, Anno: 2022 |
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150-nm GaN HEMT Degradation under Realistic Load-Line Operation
Raffo, A.; Vadala, V.; Bosi, G.; Giofre, R.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2022 17th European Microwave Integrated Circuits Conference, EuMIC 2022
pp: 141-144, Anno: 2022 |
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A GaN-SiC MMIC Doherty Power Amplifier For K-band Wireless Communications
Furxhi, S.; Marzi, S. D.; Raffo, A.; Giofre, R.; Colantonio, P.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2022 24th International Microwave and Radar Conference, MIKON 2022
pp: 1-3, Anno: 2022 |
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Evaluation of Microwave Transistor Degradation Using Low-Frequency Time-Domain Measurements
Bosi, G.; Vadala', V.; Giofre, R.; Raffo, A.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2021 34th General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2021
pp: 01-03, Anno: 2021 |
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Advanced Modelling Techniques Enabling E-Band Power Amplifier Design for 5G Backhauling
Vadala, V.; Raffo, A.; Colzani, A.; Fumagalli, M. A.; Sivverini, G.; Bosi, G.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 161-164, Anno: 2021 |
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Empowering GaN-Si HEMT Nonlinear Modelling for Doherty Power Amplifier Design
Bosi, G.; Raffo, A.; Giofre, R.; Vadala, Valeria; Vannini, G.; Limiti, E.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 249-252, Anno: 2021 |
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Advanced Measurement Techniques for Nonlinear Modelling of GaN HEMTs: From L-band to mm-Wave Applications
Vadalà, Valeria; Raffo, A.; Bosi, Gianni; Giofrè, Rocco; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2021 - Proceedings
pp: 63-69, Anno: 2021 |
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Load-Pull Measurements Oriented to Harmonically-Tuned Power Amplifier Design
Bosi, Gianni; Raffo, Antonio; Vadalà, Valeria; Vannini, Giorgio; Avolio, Gustavo; Marchetti, Mauro; Giofre', Rocco; Colantonio, Paolo; Limiti, Ernesto
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC) - Proceedings
pp: 9160151-1-9160151-3, Anno: 2020 |
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GaN FET Load-Pull Data in Circuit Simulators: a Comparative Study
Avolio, G.; Raffo, A.; Marchetti, M.; Bosi, G.; Vadalà, V.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 80-83, Anno: 2019 |
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Temperature Dependent Small-Signal Neural Modeling of High-Periphery GaN HEMTs
Marinkovic, Z.; Crupi, G.; Vadala, V.; Raffo, A.; Caddemi, A.; Markovic, V.; Schreurs, D. M. M. -P.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2019 - Proceedings
pp: 33-36, Anno: 2019 |
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A Comprehensive and Critical Overview of the Kink Effect in S22 for HEMT Technology
Crupi, G.; Raffo, A.; Marinkovic, Z.; Schreurs, D. M. M. -P.; Caddemi, A.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2019 - Proceedings
pp: 13-20, Anno: 2019 |
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GaN HEMT Model with Enhanced Accuracy under Back-off Operation
Vadala', Valeria; Raffo, Antonio; Kikuchi, Ken; Yamamoto, Hiroshi; Bosi, Gianni; Inoue, Kazutaka; Ui, Norihiko; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 37-40, Anno: 2019 |
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An Ultra-Wideband Setup to Monitor Antenna-Impedance Variations in Low-Cost IoT Transmitters
Petrocchi, Alessandra; Raffo, A.; Bosi, G.; Vannini, G.; Yavuz Kapusuz, K.; Lemey, S.; Rogier, H.; Avolio, G.; Schreurs, D.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMIC 2018 - Proceedings
pp: 1-3, Anno: 2018 |
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Comparison of GaN HEMT Technology Processes by Large-Signal Low-Frequency Measurements
Kikuchi, Ken; Yamamoto, Hiroshi; Ui, Norihiko; Inoue, Kazutaka; Vadala', Valeria; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMIC 2018 - Proceedings
pp: 8430002-1-8430002-3, Anno: 2018 |
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Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers
Yamamoto, Hiroshi; Kikuchi, Ken; Ui, Norihiko; Inoue, Kazutaka; Vadala, Valeria; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2018
pp: 44-47, Anno: 2018 |
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Evaluation of high-voltage transistor reliability under nonlinear dynamic operation
Bosi, Gianni; Raffo, Antonio; Vadala', Valeria; Trevisan, Francesco; Formicone, Gabriele; Burger, Jeff; Custer, James; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
Microwave Integrated Circuits Conference (EuMIC), 2017 12th European
pp: 248-251, Anno: 2017 |
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Extended operation of class-F power amplifiers using input waveform engineering
Cipriani, E.; Colantonio, P.; Giannini, F.; Raffo, A.; Vadala, V.; Bosi, G.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
European Microwave Conference (EuMC), 2017 47th
pp: 144-147, Anno: 2017 |
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